Type X and y errors and data & model conditioning for systematic uncertainty in model calibration, validation, and extrapolation

SAE Technical Papers

Volumn , Issue , 2008, Pages

  Romero, Vicente J ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXTRAPOLATION; SYSTEMATIC ERRORS;

DELETERIOUS EFFECTS; INPUT UNCERTAINTY; MODEL CALIBRATION; MODEL VALIDATION AND CALIBRATIONS; RANDOM UNCERTAINTIES; SYSTEMATIC UNCERTAINTIES; UNCERTAIN MODELING; UNCERTAINTY MODELING;

UNCERTAINTY ANALYSIS;

EID: 85072464593     PISSN: 01487191     EISSN: 26883627     Source Type: Journal    
DOI: 10.4271/2008-01-1368     Document Type: Conference Paper

References (34)

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