There is lot more to reliability than reliability

SAE Technical Papers

Volumn , Issue , 2004, Pages

  Raheja, Dev ^a  

^a Design for Competitiveness Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; REPAIR;

COST OF REPAIRS; INDIRECT COSTS; PRODUCT DEFINITION; RETURN ON INVESTMENTS;

RELIABILITY;

EID: 85072439763     PISSN: 01487191     EISSN: 26883627     Source Type: Journal    
DOI: 10.4271/2004-01-1286     Document Type: Conference Paper

References (3)

1. Raheja Dev, Assurance Technologies: Principles and Practices, McGraw-Hill New York, 1991.
2. Speech by, Farrow Douglas R. Dr., Fifth International Workshop on Risk Analysis and Performance Measurement in Aviation sponsored by FAA and NASA, Baltimore, August 19-21, 2003.
3. Mann Charles, C., Technology Review, MIT, July/August, 2002.