Embedded system tool to support debugging, calibration, fast prototyping and emulation

SAE Technical Papers

Volumn , Issue , 2004, Pages

  Mayer, Albrecht ^a   Siebert, Harry ^a   Leteinturier, Patrick ^a   Qual, Alexander ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; PROGRAMMABLE LOGIC CONTROLLERS; SYSTEM-ON-CHIP;

AUTOMOTIVE MICROCONTROLLERS; DEVELOPMENT CYCLE; EMBEDDED SYSTEM TOOL; ENGINE MANAGEMENT; FAST PROTOTYPING; IN-CIRCUIT EMULATOR; MISSION CRITICAL; SYSTEMS ON CHIPS;

PROGRAM DEBUGGING;

EID: 85072437389     PISSN: 01487191     EISSN: 26883627     Source Type: Journal    
DOI: 10.4271/2004-01-0304     Document Type: Conference Paper

References (2)

1. Lemon Kim, Introduction to the Universal Measurement and Calibration Protocol XCP, SAE World Congress, Detroit, March 2003.
2. Mayer A., Siebert H., Kolof S., el Baradie S., Debug Support for Complex System-on-Chips, Embedded Systems Conference, San Francisco, April 2003