SIMS 500 - Rapid low energy secondary ion mass spectrometer for in-line analysis of gaseous compounds - Technology and applications in automotive emission testing

SAE Technical Papers

Volumn , Issue , 1993, Pages

  Villinger, J ^a   Federer, W ^a   Resch, R ^a   Dornauer, A ^a   Lubich, M ^a   Sejkora, W ^a  

^a V and F Analyse und Messtechnik GmbH ^*

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOTIVE ENGINEERING; CATALYTIC CONVERTERS; INORGANIC COMPOUNDS; IONIZATION OF GASES; IONS; MASS SPECTROMETERS; SECONDARY EMISSION; SPACECRAFT INSTRUMENTS;

AUTOMOTIVE EMISSIONS; DYNAMIC STUDIES; GASEOUS COMPOUNDS; HIGH SENSITIVITY; HYDROCARBON ANALYSIS; IONIZATION PROCESS; SECONDARY ION MASS SPECTROMETERS; TRANSIENT STUDIES;

GASES;

EID: 85072419986     PISSN: 01487191     EISSN: 26883627     Source Type: Journal    
DOI: 10.4271/932017     Document Type: Conference Paper

References (0)