Research on vehicle connector aging accelerated test

SAE Technical Papers

Volumn , Issue , 1999, Pages

  Sugiyama, Yasushi ^a   Nishiwaki, Hirofumi ^a   Takahashi, Makoto ^a   Manabe, Norio ^a   Kohtake, Yoshihiro ^a  

^a Sumitomo Wiring Systems Ltd   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

OXIDE FILMS; REGRESSION ANALYSIS; TIN OXIDES;

ACCELERATED TEST METHODS; ACCELERATED TESTS; AMBIENT CONDITIONS; COPPER DIFFUSION; ENVIRONMENTAL FACTORS; FIELD DATA; OXYGEN CONCENTRATIONS; TERMINAL STATE;

VEHICLES;

EID: 85072416868     PISSN: 01487191     EISSN: 26883627     Source Type: Journal    
DOI: 10.4271/1999-01-1085     Document Type: Conference Paper

References (4)

1. Mano, K., "The reliability of the electrical contacts." Sogo Electronics Publishing Company, 1981, p.p. 69-74
2. Tamai, T., "The kinetics of the Contact surface contamination An environmental corrosion test of the contact part and its Acceleration" Clean Design, Winter, 1985,No. 28, p.p. 75-82
3. Miyamoto, Okuda, and Miyashita, "The heat diffusing of tin plated Cu-Zn alloy" Journal of the Japan Institute of Metals, 1980,. Autumn (275)
4. Nakajima, Fukuda, and Isono, "The surface oxidation on the heated copper alloy with (tin) finished" The Japanese Copper and Brass Research association, 1987,vol. 26, p.p. 168-174