Test design and acceleration for product lifetime reliability demonstration

SAE Technical Papers

Volumn , Issue , 2004, Pages

  Krasich, Milena ^a  

^a Bose Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRICULA; DEMONSTRATIONS; RELIABILITY;

ACCELERATED RELIABILITY TESTS; AUDIO AMPLIFIERS; CUSTOMER SPECIFICATIONS; PRODUCT LIFETIME; RELIABILITY DEMONSTRATION; RELIABILITY GROWTH; TIME-PERIODS; VALIDATION TESTING;

PRODUCT DESIGN;

EID: 85072411279     PISSN: 01487191     EISSN: 26883627     Source Type: Journal    
DOI: 10.4271/2004-01-1640     Document Type: Conference Paper

References (9)

1. IEC61014, Programmes for reliability growth
2. Ang Alfredo H-S., and Tang Wilson H., "Probability Concepts in Engineering Planning and Design, Volume II, Decision Risk and Reliability" 1990.
3. Dai Shu-Ho, Wang Ming-O, "Reliability Analysis in Engineering Applications" Van Nostrand Reinhold 1992.
4. IEC 61164, Statistical Methods for reliability growth
5. IEC 60300-3-1. Dependability methods, 2002.
6. Hu, J. M., Barker, D., Dasgupta, A., Arora, A., "The Role of Failure Mechanism Identification in Accelerated Testing" Journal of the Institute of Environmental Science, pp. 39-45, July 1993
7. Mann, N. M., Schaefer, R. E., & Singpurwalla, N. D., Methods for Statistical Analysis of Reliability and Life Data, John Wiley & Sons, New York, 1974
8. Pecht, M., Dasgupta, A., & Barker, D., "The Reliability Physics Approach to Failure Prediction Modeling," Quality and Reliability Engineering International, pp. 276-273, 1990
9. Caruso, H., "Hidden Assumptions in Temperature and Vibration Test Time Compression Models Used for Durability Testing" 1994 Proceedings, IES Technical meeting, pp 107-115