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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4086, Issue , 2000, Pages 23-26

Characterization of optical storage media films by time-of-flight-energy elastic recoil detection analysis

(5) Zhang, Yanwen a Possnert, Goran a Jonsson, Lars b Winzell, Thomas c Whitlow, Harry J c

a UPPSALA UNIVERSITY (Sweden)

b M2 Engineering AB (Sweden)

c LUND INSTITUTE OF TECHNOLOGY (Sweden)

Author keywords

CD R; CD ROM; CD RW; Optical storage media; Phase change; ToF E ERDA

Indexed keywords

COMPUTER GRAPHICS; ELECTRONIC DOCUMENT EXCHANGE; HEAVY IONS; MULTIMEDIA SYSTEMS;

DIGITAL VIDEO DISCS; ELASTIC RECOIL DETECTION ANALYSIS; HIGH-ENERGY HEAVY IONS; OPTICAL STORAGE MEDIA; OPTICAL TECHNOLOGY; RANDOM ACCESS MEMORY; STORAGE MEDIA; TIME OF FLIGHT;

RANDOM ACCESS STORAGE;

EID: 85069014473 PISSN: 0277786X EISSN: 1996756X Source Type: Conference Proceeding
DOI: 10.1117/12.408426 Document Type: Conference Paper

Times cited : (1)

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