The angular distribution of elastically scattered electrons and computed impact on collector performance

Technical Digest - International Electron Devices Meeting, IEDM

Volumn 1992-December, Issue , 1992, Pages 953-956

  Krainsky, I L ^a   Vaden, K R ^a   Curren, A N ^a   Dayton, J A ^a   Mearini, G T ^b  

^a NASA GLENN RESEARCH CENTER   (United States)

^b CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DEVICES; ELECTRONS; SECONDARY EMISSION;

DESIGN AND OPERATIONS; GRAZING INCIDENCE; INCIDENT ELECTRON BEAMS; INCIDENT ENERGY; POLISHED SURFACES; SCATTERED ELECTRONS; SECONDARY ELECTRONS; SPUTTERED SURFACES;

ANGULAR DISTRIBUTION;

EID: 85067409893     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.1992.307514     Document Type: Conference Paper

References (4)

1. P. Ramins and B. T. Ebihara, "Improvements in MDC and TWT Overall Efficiency through Application of Carbon Electrode Surfaces, " IEEE Trans. Electron Devices, vol. ED-33, no. 11, pp. 1915-1924, November 1986.
2. D. A. Force, "Calcuation of Secondary Electron Trajectories in Multistage Depressed Collectors for Microwave Amplifiers, " NASA TP-2664, 1986.
3. A. N. Curren, K. A. Jensen and R. F. Roman, "Secondary Electron Emission Characteristics of Molybdenum-Masked, Ion-Textured OFHC Copper, " NASA TP 2967, January 1990.
4. W. B. Herrmannsfeldt. SLAC-166, Stanford Liniar Accerelator Center (1973).