Physical-layer identification of RFID devices

Proceedings of the 18th USENIX Security Symposium

Volumn , Issue , 2009, Pages 199-214

  Danev, Boris ^a   Heydt Benjamin, Thomas S ^b   Čapkun, Srdjan ^a  

^a ETH ZURICH   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

NETWORK LAYERS; SMART CARDS; TRANSPONDERS;

CONTROLLED ENVIRONMENT; ELECTRONIC PASSPORTS; EQUAL ERROR RATE; IDENTIFICATION ACCURACY; IDENTIFICATION OF INDIVIDUALS; PHYSICAL LAYER PROPERTIES; PHYSICAL LAYERS; RFID TRANSPONDERS;

RADIO FREQUENCY IDENTIFICATION (RFID);

EID: 85066934773     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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