Heavy ion testing using the ganil accelerator and compilation of results with predictions

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1992, Pages 21-26

  Dufour, C ^a   Garnier, P ^a   Beaucour, J ^a   Delagrange, H ^a   Ganil, ^b  

^a AIRBUS DEFENCE AND SPACE   (Germany)

^b Boulevard Henri Becquerel BP5027 ^*  (France)

Author keywords

[No Author keywords available]

Indexed keywords

HEAVY IONS;

ELECTRONIC COMPONENT; HEAVY ION TESTING; IRRADIATION TEST; MARCONI; OPERATIONAL SYSTEMS; TEST SYSTEMS; UPSET RATES; VERY HIGH ENERGIES;

RADIATION EFFECTS;

EID: 85064688897     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.1992.247329     Document Type: Conference Paper

References (6)

1. M. Labrune, R. Ecoffet, J. Beaucour, C. Dufour, M. Romdro, S. Duzellier. " CECIL Heavy Ion component test coordination" 1st European Conference on Radiation effects on Devices and System. RADECS 1991 p577.
2. Petersen, J. B. Langworthy and S. E. Diehl "Suggested Single Event Upset figure of merit", IEEE Trans, on Nucl. Science Vol. NS-30, no 6, Dec. 1983.
3. Pickel and J. T. Blandford "Cosmic Ray induced Errors in MOS memory cells", IEEE Trans, on Nucl. Science Vol. NS-25, no 6, Dec. 1978.
4. Adams J. H. "Cosmic Ray Effects on Microelectronics" part IV, NRL Memorandum Report 5901, Naval Research Laboratory, Dec. 1986.
5. R. Harboe-Sorenson, L. Adams, E. J. Daly, C. Sansoe, D. Mapper, J. K. Sanderson, "The S. E. U. Risk Assessment of Z80A, 8086 and 80C86 Microprocessors intended for use in a low altitude polar orbit", IEEE Trans, on Nucl. Science Vol. NS-33, no 6, Dec. 1986.
6. Internal heavy Ion Reports from MATRA MARCONI SPACE.