Technology mapping using Boolean matching and don't care sets

Proceedings of the European Design Automation Conference, EDAC 1990

Volumn , Issue , 1990, Pages 212-216

  Mailhot, Fridirk ^a   De Micheli, Giovanni ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; SOFTWARE TESTING;

BENCHMARK CIRCUIT; BOOLEAN MATCHING; BOOLEAN OPERATIONS; DON'T-CARES; MATCHING ALGORITHM; NEW APPROACHES; SHANNON DECOMPOSITION; TECHNOLOGY MAPPING;

MAPPING;

EID: 85061355883     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EDAC.1990.136647     Document Type: Conference Paper

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