System-level robustness through integrated modeling

Proceedings of the ASME Design Engineering Technical Conference

Volumn 4, Issue , 1999, Pages 285-293

  Suri, Rajiv ^a   Otto, Kevin ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SENSITIVITY ANALYSIS; STRETCH FORMING;

DESIGNED EXPERIMENTS; INTEGRATED MODELING; INTEGRATED PARAMETER; INTEGRATED SYSTEM MODELS; MANUFACTURING OPERATIONS; MULTIPLE OPERATIONS; SYSTEM-LEVEL MODELING; VARIATION REDUCTIONS;

PRODUCT DESIGN;

EID: 85059518179     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/DETC99/DFM-8966     Document Type: Conference Paper

References (16)

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