Discharge of MNOS structures

Solid State Electronics

Volumn 16, Issue 7, 1973, Pages 811-823

  Lundkvist, L ^a   Lundstrom I ^a   Svensson, C ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, SEMICONDUCTOR;

TRANSISTORS;

EID: 85058248748     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(73)90178-0     Document Type: Article

References (14)

1. Theory of the thin-oxide m.n.o.s. memory transistor
2. Properties of MNOS structures
3. Carrier trapping hysteresis in MOS transistors
4. MNOS memory transistors in simple memory arrays
5. Tunneling to traps in insulators
6. Thin Tunnelable Layers of Silicon Dioxide Formed by Oxidation of Silicon
7. Electrical Characteristics of Silicon Nitride Films Prepared by Silane-Ammonia Reaction