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Volumn , Issue , 2000, Pages 1515-1548

Macro- and microtribology of MEMS materials

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EID: 85056948771     PISSN: None     EISSN: None     Source Type: Book    
DOI: None     Document Type: Chapter
Times cited : (14)

References (91)
  • 1
    • 0022717983 scopus 로고
    • Fabrication of microstructures with high aspect ratios and great structural heights by synchrotron radiation lithography, galvanoforming, and plastic moulding (LIGA Process)
    • Becker, E.W., Ehrfeld, W., Hagmann, P., Maner, A., and Munchmeyer, D. (1986), Fabrication of microstructures with high aspect ratios and great structural heights by synchrotron radiation lithography, galvanoforming, and plastic moulding (LIGA Process), Microelectronic Eng., 4, 35-56.
    • (1986) Microelectronic Eng. , vol.4 , pp. 35-56
    • Becker, E.W.1    Ehrfeld, W.2    Hagmann, P.3    Maner, A.4    Munchmeyer, D.5
  • 7
    • 0031902754 scopus 로고    scopus 로고
    • Contact mechanics of rough surfaces in tribology: Multiple asperity contact
    • Bhushan, B. (1998b), Contact mechanics of rough surfaces in tribology: multiple asperity contact, Tribol. Lett., 4, 1-35.
    • (1998) Tribol. Lett. , vol.4 , pp. 1-35
    • Bhushan, B.1
  • 10
    • 0033377792 scopus 로고    scopus 로고
    • Chemical, mechanical and tribological characterization of ultra-thin and hard amorphous carbon coatings as thin as 3.5 nm: Recent developments
    • Bhushan, B. (1999c), Chemical, mechanical and tribological characterization of ultra-thin and hard amorphous carbon coatings as thin as 3.5 nm: recent developments, Diamond and Rel. Mater., 8, 1985-2015.
    • (1999) Diamond and Rel. Mater. , vol.8 , pp. 1985-2015
    • Bhushan, B.1
  • 13
    • 0030282664 scopus 로고    scopus 로고
    • Microtribological studies of doped single-crystal silicon and polysilicon films for MEMS devices
    • Bhushan, B. and Koinkar, V.N. (1997a), Microtribological studies of doped single-crystal silicon and polysilicon films for MEMS devices, Sensors and Actuators, A 57, 91-102.
    • (1997) Sensors and Actuators, A , vol.57 , pp. 91-102
    • Bhushan, B.1    Koinkar, V.N.2
  • 14
    • 0000659906 scopus 로고
    • Tribological studies of silicon for magnetic recording applications
    • Bhushan B. and Koinkar, V.N. (1994), Tribological studies of silicon for magnetic recording applications, J. Appl. Phys., 75, 5741-5746.
    • (1994) J. Appl. Phys. , vol.75 , pp. 5741-5746
    • Bhushan, B.1    Koinkar, V.N.2
  • 15
    • 0030869870 scopus 로고    scopus 로고
    • Micromechanical and tribological characterization of doped single-crystal silicon and polysilicon films for microelectromechanical systems
    • Bhushan, B. and Li, X. (1997b), Micromechanical and tribological characterization of doped single-crystal silicon and polysilicon films for microelectromechanical systems, J. Mater. Res., 12, 1-10.
    • (1997) J. Mater. Res. , vol.12 , pp. 1-10
    • Bhushan, B.1    Li, X.2
  • 16
    • 0000117873 scopus 로고
    • Mechanical and tribological properties of silicon for micromechanical applications: A review
    • Bhushan, B. and Venkatesan, S. (1993a), Mechanical and tribological properties of silicon for micromechanical applications: a review, Adv. Info. Storage Syst., 5, 211-239.
    • (1993) Adv. Info. Storage Syst. , vol.5 , pp. 211-239
    • Bhushan, B.1    Venkatesan, S.2
  • 17
    • 0027625124 scopus 로고
    • Friction and wear studies of silicon in sliding contact with thinfilm magnetic rigid disks
    • Bhushan, B. and Venkatesan, S. (1993b), Friction and wear studies of silicon in sliding contact with thinfilm magnetic rigid disks, J. Mater. Res., 8, 1611-1628.
    • (1993) J. Mater. Res. , vol.8 , pp. 1611-1628
    • Bhushan, B.1    Venkatesan, S.2
  • 18
    • 0026911598 scopus 로고
    • Contact start-stop studies with silicon planar head sliders against thin-film disks
    • Bhushan, B., Dominiak, M., and Lazarri, J.P. (1992), Contact start-stop studies with silicon planar head sliders against thin-film disks, IEEE Trans. Magn., 28, 2874-2876.
    • (1992) IEEE Trans. Magn. , vol.28 , pp. 2874-2876
    • Bhushan, B.1    Dominiak, M.2    Lazarri, J.P.3
  • 19
    • 0029292717 scopus 로고
    • Nanotribology: Friction, wear and lubrication at the atomic scale
    • Bhushan, B., Israelachvili, J.N., and Landman, U. (1995a), Nanotribology: friction, wear and lubrication at the atomic scale, Nature, 374, 607-616.
    • (1995) Nature , vol.374 , pp. 607-616
    • Bhushan, B.1    Israelachvili, J.N.2    Landman, U.3
  • 20
    • 33745482231 scopus 로고
    • Microtribological characterization of self-assembled and Langmuir-Blodgett monolayers by atomic force and friction force microscopy
    • Bhushan, B., Kulkarni, A.V., Koinkar, V.N., Boehm, M., Odoni, L., Martelet, C., and Belin, M. (1995b), Microtribological characterization of self-assembled and Langmuir-Blodgett monolayers by atomic force and friction force microscopy, Langmuir, 11, 3189-3198.
    • (1995) Langmuir , vol.11 , pp. 3189-3198
    • Bhushan, B.1    Kulkarni, A.V.2    Koinkar, V.N.3    Boehm, M.4    Odoni, L.5    Martelet, C.6    Belin, M.7
  • 21
    • 0005317013 scopus 로고    scopus 로고
    • Micro/nanotribological studies of single-crystal silicon and polysilicon and SiC films for use in MEMS devices
    • Bhushan, B. (Ed.), Kluwer Academic, Dordrecht, The Netherlands
    • Bhushan, B., Sundararajan, S., Li, X., Zorman, C.A., and Mehregany, M. (1998), Micro/nanotribological studies of single-crystal silicon and polysilicon and SiC films for use in MEMS devices, Tribology Issues and Opportunities in MEMS, Bhushan, B. (Ed.), Kluwer Academic, Dordrecht, The Netherlands.
    • (1998) Tribology Issues and Opportunities in MEMS
    • Bhushan, B.1    Sundararajan, S.2    Li, X.3    Zorman, C.A.4    Mehregany, M.5
  • 23
    • 0026898993 scopus 로고
    • The extent of phase transformation in silicon hardness indentation
    • Callahan, D.L. and Morris, J.C. (1992), The extent of phase transformation in silicon hardness indentation, J. Mater. Res., 7, 1612-1617.
    • (1992) J. Mater. Res. , vol.7 , pp. 1612-1617
    • Callahan, D.L.1    Morris, J.C.2
  • 24
    • 0027610335 scopus 로고
    • Micromechanical fatigue testing
    • Connally, J.A. and Brown, S.B. (1993), Micromechanical fatigue testing, Exp. Mech., 33, 81-90.
    • (1993) Exp. Mech. , vol.33 , pp. 81-90
    • Connally, J.A.1    Brown, S.B.2
  • 25
    • 0029202106 scopus 로고
    • Performance impact of monolayer coatings of polysilicon micromotors
    • Amsterdam, Netherlands, Jan–Feb
    • Deng, K., Collins, R.J., Mehregany, M., and Sukenik, C.N. (1995), Performance impact of monolayer coatings of polysilicon micromotors, in Proc. MEMS 95, Amsterdam, Netherlands, Jan–Feb.
    • (1995) Proc. MEMS 95
    • Deng, K.1    Collins, R.J.2    Mehregany, M.3    Sukenik, C.N.4
  • 26
    • 0000416997 scopus 로고
    • Micromechanical fracture strength of silicon
    • Ericson, F. and Schweitz, J.A. (1990), Micromechanical fracture strength of silicon, J. Appl. Phys., 68, 5840-5844.
    • (1990) J. Appl. Phys. , vol.68 , pp. 5840-5844
    • Ericson, F.1    Schweitz, J.A.2
  • 28
    • 0029327467 scopus 로고
    • Magnetic recording head positioning at very high track densities using a microactuator-based, two-stage servo system
    • Fan, L.S., Ottesen, H.H., Reiley, T.C., and Wood, R.W. (1995), Magnetic recording head positioning at very high track densities using a microactuator-based, two-stage servo system, IEEE Trans. Ind. Electron., 42, 222-233.
    • (1995) IEEE Trans. Ind. Electron. , vol.42 , pp. 222-233
    • Fan, L.S.1    Ottesen, H.H.2    Reiley, T.C.3    Wood, R.W.4
  • 29
    • 0029514425 scopus 로고
    • Comments on measuring thin-film stresses using bi-layer micromachined beams
    • Fang, W. and Wickert, J.A. (1995), Comments on measuring thin-film stresses using bi-layer micromachined beams, J. Micromech. Microeng., 5, 276-281.
    • (1995) J. Micromech. Microeng. , vol.5 , pp. 276-281
    • Fang, W.1    Wickert, J.A.2
  • 30
    • 0005282373 scopus 로고    scopus 로고
    • Surface Characterization of Non-Lithographic Micromachining
    • Bhushan, B. (Ed.), Kluwer Academic, Dordrecht, The Netherlands
    • Friedrich, C.R. and Warrington, R.O. (1998), Surface Characterization of Non-Lithographic Micromachining, in Tribology Issues and Opportunities in MEMS, Bhushan, B. (Ed.), Kluwer Academic, Dordrecht, The Netherlands, 73-84.
    • (1998) Tribology Issues and Opportunities in MEMS , pp. 73-84
    • Friedrich, C.R.1    Warrington, R.O.2
  • 32
    • 0025698150 scopus 로고
    • In situ friction and wear measurement in integrated polysilicon mechanisms
    • Gabriel, K.J., Behi, F., Mahadevan, R., and Mehregany, M. (1990), In situ friction and wear measurement in integrated polysilicon mechanisms, Sensors and Actuators, A 21-23, 184-188.
    • (1990) Sensors and Actuators, A , vol.21-23 , pp. 184-188
    • Gabriel, K.J.1    Behi, F.2    Mahadevan, R.3    Mehregany, M.4
  • 33
    • 0014881184 scopus 로고
    • The micro-hardness of metals at very light loads, Philos
    • Gane, N. and Cox, J.M. (1970), The micro-hardness of metals at very light loads, Philos. Mag., 22, 881-891.
    • (1970) Mag. , vol.22 , pp. 881-891
    • Gane, N.1    Cox, J.M.2
  • 34
    • 0024767646 scopus 로고
    • Fabrication of micromechanical devices from polysilicon films with smooth surfaces
    • Guckel, H. and Burns, D.W. (1989), Fabrication of micromechanical devices from polysilicon films with smooth surfaces, Sensors and Actuators, 20, 117-122.
    • (1989) Sensors and Actuators , vol.20 , pp. 117-122
    • Guckel, H.1    Burns, D.W.2
  • 36
    • 0026873781 scopus 로고
    • Diagnostic microstructures for the measurement of intrinsic strain in thin films
    • Guckel, H., Burns, D., Rutigliano, C., Lovell, E., and Choi, B. (1992), Diagnostic microstructures for the measurement of intrinsic strain in thin films, J. Micromech. Microeng., 2, 86-95.
    • (1992) J. Micromech. Microeng. , vol.2 , pp. 86-95
    • Guckel, H.1    Burns, D.2    Rutigliano, C.3    Lovell, E.4    Choi, B.5
  • 37
    • 0028729968 scopus 로고
    • Nanoindentation studies of ion implanted silicon
    • Gupta, B.K. and Bhushan, B. (1994), Nanoindentation studies of ion implanted silicon, Surf. Coat. Technol., 68/69, 564-570.
    • (1994) Surf. Coat. Technol. , vol.68-69 , pp. 564-570
    • Gupta, B.K.1    Bhushan, B.2
  • 38
    • 0027626446 scopus 로고
    • Tribology of ion bombarded silicon for micromechanical applications
    • Gupta, B.K., Chevallier, J., and Bhushan, B. (1993), Tribology of ion bombarded silicon for micromechanical applications, ASME J. Tribol., 115, 392-399.
    • (1993) ASME J. Tribol. , vol.115 , pp. 392-399
    • Gupta, B.K.1    Chevallier, J.2    Bhushan, B.3
  • 39
    • 0028468866 scopus 로고
    • Modification of tribological properties of silicon by boron ion implantation
    • Gupta, B.K., Bhushan, B., and Chevallier, J. (1994), Modification of tribological properties of silicon by boron ion implantation, Tribol. Trans., 37, 601-607.
    • (1994) Tribol. Trans. , vol.37 , pp. 601-607
    • Gupta, B.K.1    Bhushan, B.2    Chevallier, J.3
  • 40
    • 0001516172 scopus 로고
    • Contact recording on perpendicular rigid media
    • Hamilton, H. (1991), Contact recording on perpendicular rigid media, J. Mag. Soc. Jpn., 15(Suppl. S2), 483-481.
    • (1991) J. Mag. Soc. Jpn. , vol.15 , Issue.S2 , pp. 481-483
    • Hamilton, H.1
  • 41
    • 0003597031 scopus 로고
    • Properties of Silicon Carbide
    • London
    • Harris, G.L. (Ed.) (1995), Properties of Silicon Carbide, Inst. of Elect. Eng., London.
    • (1995) Inst. of Elect. Eng
    • Harris, G.L.1
  • 42
    • 0030726261 scopus 로고    scopus 로고
    • Lubrication of digital micromirror devices
    • Henck, S.A. (1997), Lubrication of digital micromirror devices, Tribol. Lett., 3, 239-247.
    • (1997) Tribol. Lett. , vol.3 , pp. 239-247
    • Henck, S.A.1
  • 43
    • 0023964517 scopus 로고
    • An experimental and theoretical investigation of ploughing, cutting and wedge forming during abrasive wear
    • Hokkirigawa, K. and Kato, K. (1988), An experimental and theoretical investigation of ploughing, cutting and wedge forming during abrasive wear, Tribol. Int., 21, 51-57.
    • (1988) Tribol. Int. , vol.21 , pp. 51-57
    • Hokkirigawa, K.1    Kato, K.2
  • 46
    • 0000988792 scopus 로고    scopus 로고
    • Micro/nanoscale studies of boundary layers of liquid lubricants for magnetic disks
    • Koinkar, V.N. and Bhushan, B. (1996a), Micro/nanoscale studies of boundary layers of liquid lubricants for magnetic disks, J. Appl. Phys., 79, 8071-8075.
    • (1996) J. Appl. Phys. , vol.79 , pp. 8071-8075
    • Koinkar, V.N.1    Bhushan, B.2
  • 47
    • 0030480544 scopus 로고    scopus 로고
    • Microtribological studies of unlubricated and lubricated surfaces using atomic force/friction force microscopy
    • Koinkar, V.N. and Bhushan, B. (1996b), Microtribological studies of unlubricated and lubricated surfaces using atomic force/friction force microscopy, J. Vac. Sci. Technol., A14, 2378-2391.
    • (1996) J. Vac. Sci. Technol. , vol.14 , pp. 2378-2391
    • Koinkar, V.N.1    Bhushan, B.2
  • 48
    • 0031332581 scopus 로고    scopus 로고
    • Scanning and transmission electron microscopies of single-crystal silicon microworn/micromachined using atomic force microscopy
    • Koinkar, V.N. and Bhushan, B. (1997), Scanning and transmission electron microscopies of single-crystal silicon microworn/micromachined using atomic force microscopy, J. Mater. Res., 12, 3219-3224.
    • (1997) J. Mater. Res. , vol.12 , pp. 3219-3224
    • Koinkar, V.N.1    Bhushan, B.2
  • 49
    • 0024733045 scopus 로고
    • A new thin film head generation IC head
    • Lazarri, J.P. and Deroux-Dauphin, P. (1989), A new thin film head generation IC head, IEEE Trans. Magn., 25, 3190-3193.
    • (1989) IEEE Trans. Magn. , vol.25 , pp. 3190-3193
    • Lazarri, J.P.1    Deroux-Dauphin, P.2
  • 52
    • 0032632404 scopus 로고    scopus 로고
    • Micro/nanomechanical characterization of ceramic films for microdevices
    • Li, X. and Bhushan, B. (1999), Micro/nanomechanical characterization of ceramic films for microdevices, Thin Solid Films, 340, 210-217.
    • (1999) Thin Solid Films , vol.340 , pp. 210-217
    • Li, X.1    Bhushan, B.2
  • 54
    • 0031707293 scopus 로고    scopus 로고
    • Surface process in MEMS technology
    • Maboudian, R. (1998), Surface process in MEMS technology, Surf. Sci. Rep., 30, 209-269.
    • (1998) Surf. Sci. Rep. , vol.30 , pp. 209-269
    • Maboudian, R.1
  • 55
    • 0001064718 scopus 로고    scopus 로고
    • Stiction reduction process for surface micromachines
    • Maboudian, R. and Howe, R.T. (1997), Stiction reduction process for surface micromachines, Tribol. Lett., 3, 215-221.
    • (1997) Tribol. Lett. , vol.3 , pp. 215-221
    • Maboudian, R.1    Howe, R.T.2
  • 57
    • 0002858290 scopus 로고    scopus 로고
    • Facilitating choices of machining tools and materials for miniaturization science: A review
    • Bhushan, B. (Ed.), Kluwer Academic, Dordrecht, The Netherlands
    • Madou, M. (1998), Facilitating choices of machining tools and materials for miniaturization science: a review, Tribology Issues and Opportunities in MEMS, Bhushan, B. (Ed.), Kluwer Academic, Dordrecht, The Netherlands, 31-51.
    • (1998) Tribology Issues and Opportunities in MEMS , pp. 31-51
    • Madou, M.1
  • 58
    • 2342584918 scopus 로고    scopus 로고
    • Adhesion-related failure mechanisms in micromechanical devices
    • Mastrangelo, C.H. (1997), Adhesion-related failure mechanisms in micromechanical devices, Tribol. Lett., 3, 233-238.
    • (1997) Tribol. Lett. , vol.3 , pp. 233-238
    • Mastrangelo, C.H.1
  • 59
    • 0000725322 scopus 로고    scopus 로고
    • Experimental determination of mechanical properties of Ni and Ni-Fe microbars
    • Mazza, E., Abel, S., and Dual, J. (1996), Experimental determination of mechanical properties of Ni and Ni-Fe microbars, Microsystem Technologies, 2, 197-202.
    • (1996) Microsystem Technologies , vol.2 , pp. 197-202
    • Mazza, E.1    Abel, S.2    Dual, J.3
  • 61
    • 0001424495 scopus 로고
    • Novel microstructures for the in-situ measurement of mechanical properties of thin films
    • Mehregany, M., Howe, R.T., and Senturia, S.D. (1987), Novel microstructures for the in-situ measurement of mechanical properties of thin films, J. Appl. Phys., 62, 3579-3584.
    • (1987) J. Appl. Phys. , vol.62 , pp. 3579-3584
    • Mehregany, M.1    Howe, R.T.2    Senturia, S.D.3
  • 65
    • 0002885733 scopus 로고    scopus 로고
    • Microfabrication technologies for high performance microactuators
    • Bhushan, B. (Ed.), Kluwer Academic, Dordrecht, The Netherlands
    • Michel, F. and Ehrfeld, W. (1998), Microfabrication technologies for high performance microactuators, in Tribology Issues and Opportunities in MEMS, Bhushan, B. (Ed.), Kluwer Academic, Dordrecht, The Netherlands, 53-72.
    • (1998) Tribology Issues and Opportunities in MEMS , pp. 53-72
    • Michel, F.1    Ehrfeld, W.2
  • 66
    • 0029327168 scopus 로고
    • Silicon micromachined scaled technology
    • Miu, D.K. and Tai, Y.C. (1995), Silicon micromachined scaled technology, IEEE Trans. Industr. Electron., 42, 234-239.
    • (1995) IEEE Trans. Industr. Electron. , vol.42 , pp. 234-239
    • Miu, D.K.1    Tai, Y.C.2
  • 68
    • 0027702493 scopus 로고
    • Development of integrated suspension system for a nanoslider with an MR head transducer
    • Ohwe, T., Mizoshita, Y., and Yonoeka, S. (1993), Development of integrated suspension system for a nanoslider with an MR head transducer, IEEE Trans. Magn., 29, 3924-3926.
    • (1993) IEEE Trans. Magn. , vol.29 , pp. 3924-3926
    • Ohwe, T.1    Mizoshita, Y.2    Yonoeka, S.3
  • 69
    • 0018496252 scopus 로고
    • Micromechanical membrane switches on silicon
    • Peterson, K.E. (1979), Micromechanical membrane switches on silicon, IBM J. Res. Dev., 23, 376.
    • (1979) IBM J. Res. Dev. , vol.23 , pp. 376
    • Peterson, K.E.1
  • 70
    • 0020127035 scopus 로고
    • Silicon as a mechanical material
    • Peterson, K.E. (1982), Silicon as a mechanical material, Proc. IEEE, 70, 420-457.
    • (1982) Proc. IEEE , vol.70 , pp. 420-457
    • Peterson, K.E.1
  • 71
    • 0001818087 scopus 로고
    • The anomalous behavior of silicon during nanoindentation
    • Nix, N.D., Bravman, J.C., Arzt, E., and Freund, L.B. (Eds.), Materials Research Soc., Pittsburgh, PA
    • Pharr, G.M. (1991), The anomalous behavior of silicon during nanoindentation, in Thin Films: Stresses and Mechanical Properties III, Vol. 239, Nix, N.D., Bravman, J.C., Arzt, E., and Freund, L.B. (Eds.), Materials Research Soc., Pittsburgh, PA, 301-312.
    • (1991) Thin Films: Stresses and Mechanical Properties III , vol.239 , pp. 301-312
    • Pharr, G.M.1
  • 73
    • 0032208479 scopus 로고    scopus 로고
    • An electrostatically actuated integrated microflow controller
    • Robertson, J.K. and Wise, K.D. (1998), An electrostatically actuated integrated microflow controller, Sensors and Actuators, A 71, 98-106.
    • (1998) Sensors and Actuators, A , vol.71 , pp. 98-106
    • Robertson, J.K.1    Wise, K.D.2
  • 74
    • 0022174543 scopus 로고
    • Use of the indentation size effect on microhardness for materials characterization
    • Blau, P.J. and Lawn, B.R. (Eds.), STP 889, ASTM, Philadelphia, PA
    • Sargent, P.M. (1986), Use of the indentation size effect on microhardness for materials characterization, in Microindentation Techniques in Materials Science and Engineering, Blau, P.J. and Lawn, B.R. (Eds.), STP 889, ASTM, Philadelphia, PA, 160-174.
    • (1986) Microindentation Techniques in Materials Science and Engineering , pp. 160-174
    • Sargent, P.M.1
  • 75
    • 0026119395 scopus 로고
    • A new and simple approach to the stress-strain characteristics of thin coatings
    • Schweitz, J.A. (1991), A new and simple approach to the stress-strain characteristics of thin coatings, J. Micromech. Microeng., 1, 10-15.
    • (1991) J. Micromech. Microeng. , vol.1 , pp. 10-15
    • Schweitz, J.A.1
  • 79
    • 0032523974 scopus 로고    scopus 로고
    • Micro/nanotribological studies of polysilicon and SiC films for MEMS applications
    • Sundararajan, S. and Bhushan, B. (1998), Micro/nanotribological studies of polysilicon and SiC films for MEMS applications, Wear, 217, 251-261.
    • (1998) Wear , vol.217 , pp. 251-261
    • Sundararajan, S.1    Bhushan, B.2
  • 80
    • 0025698090 scopus 로고
    • Frictional study of IC processed micromotors
    • Tai, Y.C. and Muller, R.S. (1990), Frictional study of IC processed micromotors, Sensors and Actuators, A 21-23, 180-183.
    • (1990) Sensors and Actuators, A , vol.21-23 , pp. 180-183
    • Tai, Y.C.1    Muller, R.S.2
  • 82
    • 4243882241 scopus 로고    scopus 로고
    • Development, fabrication and testing of a multi-stage micro gear system
    • Bhushan, B. (Ed.), Kluwer Academic, Dordrecht, The Netherlands
    • Thurigen, C., Ehrfeld, W., Hagemann, B., Lehr, H., and Michel, F. (1998), Development, fabrication and testing of a multi-stage micro gear system, in Tribology Issues and Opportunities in MEMS, Bhushan, B. (Ed.), Kluwer Academic, Dordrecht, The Netherlands, 397-402.
    • (1998) Tribology Issues and Opportunities in MEMS , pp. 397-402
    • Thurigen, C.1    Ehrfeld, W.2    Hagemann, B.3    Lehr, H.4    Michel, F.5
  • 83
    • 0000375672 scopus 로고
    • Mechanical properties of 3C silicon carbide
    • Tong, L., Mehregany, M., and Matus, L.G. (1992), Mechanical properties of 3C silicon carbide, Appl. Phys. Lett., 60, 2992-2994.
    • (1992) Appl. Phys. Lett. , vol.60 , pp. 2992-2994
    • Tong, L.1    Mehregany, M.2    Matus, L.G.3
  • 84
    • 85051990832 scopus 로고    scopus 로고
    • Classic and Seminal Papers to 1990, IEEE Press, New York
    • Trimmer, W.S. (Ed.) (1997), Micromachines and MEMS, Classic and Seminal Papers to 1990, IEEE Press, New York.
    • (1997) Micromachines and MEMS
    • Trimmer, W.S.1
  • 85
    • 0000505761 scopus 로고
    • The role of environment in the friction and wear of single-crystal silicon in sliding contact with thin-film magnetic rigid disks
    • Venkatesan, S. and Bhushan, B. (1993), The role of environment in the friction and wear of single-crystal silicon in sliding contact with thin-film magnetic rigid disks, Adv. Info Storage Syst., 5, 241-257.
    • (1993) Adv. Info Storage Syst. , vol.5 , pp. 241-257
    • Venkatesan, S.1    Bhushan, B.2
  • 86
    • 0028342098 scopus 로고
    • The sliding friction and wear behavior of single-crystal, polycrystalline and oxidized silicon
    • Venkatesan, S. and Bhushan, B. (1994), The sliding friction and wear behavior of single-crystal, polycrystalline and oxidized silicon, Wear, 171, 25-32.
    • (1994) Wear , vol.171 , pp. 25-32
    • Venkatesan, S.1    Bhushan, B.2
  • 87
    • 0000195904 scopus 로고    scopus 로고
    • Fracture testing of silicon microcantilever beams
    • Wilson, C.J., Ormeggi, A., and Narbutovskih, M. (1996), Fracture testing of silicon microcantilever beams, J. Appl. Phys., 79, 2386-2393.
    • (1996) J. Appl. Phys. , vol.79 , pp. 2386-2393
    • Wilson, C.J.1    Ormeggi, A.2    Narbutovskih, M.3
  • 88
    • 0031412468 scopus 로고    scopus 로고
    • Friction and durability of ceramic slider materials in contact with lubricated thin-film rigid disks
    • Xu, J. and Bhushan, B. (1997), Friction and durability of ceramic slider materials in contact with lubricated thin-film rigid disks, Proc. Inst. Mech. Eng., Part J: J. Eng. Tribol., 211, 303-316.
    • (1997) Proc. Inst. Mech. Eng., Part J: J. Eng. Tribol. , vol.211 , pp. 303-316
    • Xu, J.1    Bhushan, B.2
  • 89
    • 0032461278 scopus 로고    scopus 로고
    • Material removal mechanisms of single-crystal silicon on nanoscale and at ultra-low loads
    • Zhao, X. and Bhushan, B. (1998), Material removal mechanisms of single-crystal silicon on nanoscale and at ultra-low loads, Wear, 223, 66-78.
    • (1998) Wear , vol.223 , pp. 66-78
    • Zhao, X.1    Bhushan, B.2
  • 90
    • 36449003431 scopus 로고
    • Epitaxial growth of 3C-SiC films on 4 in. Diam Si(100) silicon wafers by atmospheric pressure chemical vapor deposition
    • Zorman, C.A., Fleischmann, A.J., Dewa, A.S., Mehregany, M., Jacob, C., Nishino, S., and Pirouz, P. (1995), Epitaxial growth of 3C-SiC films on 4 in. diam Si(100) silicon wafers by atmospheric pressure chemical vapor deposition, J. Appl. Phys., 78, 5136-5138.
    • (1995) J. Appl. Phys. , vol.78 , pp. 5136-5138
    • Zorman, C.A.1    Fleischmann, A.J.2    Dewa, A.S.3    Mehregany, M.4    Jacob, C.5    Nishino, S.6    Pirouz, P.7
  • 91
    • 0032001410 scopus 로고    scopus 로고
    • Characterization of polycrystalline silicon carbide films grown by atmospheric pressure chemical vapor deposition on polycrystalline silicon
    • Zorman, C.A., Roy, S., Wu, C.H., Fleischman, A.J., and Mehregany, M. (1998), Characterization of polycrystalline silicon carbide films grown by atmospheric pressure chemical vapor deposition on polycrystalline silicon, J. Mater. Res., 13, 406-412.
    • (1998) J. Mater. Res. , vol.13 , pp. 406-412
    • Zorman, C.A.1    Roy, S.2    Wu, C.H.3    Fleischman, A.J.4    Mehregany, M.5


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