Defects in microelectronic materials and devices

Defects in Microelectronic Materials and Devices

Volumn , Issue , 2008, Pages 1-755

  Fleetwood, Daniel M ^a   Pantelides, Sokrates T ^b   Schrimpf, Ronald D ^a  

^a VANDERBILT UNIVERSITY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

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Indexed keywords

EID: 85056912674     PISSN: None     EISSN: None     Source Type: Book    
DOI: None     Document Type: Book

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