Electrical conductivity and resistivity

Electrical Measurement, Signal Processing, and Displays

Volumn , Issue , 2003, Pages 7-1-7-14

  Heaney, Michael B ^a  

^a PALO ALTO RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85056306800     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1201/9780203009406     Document Type: Chapter

References (10)

1. P. Drude, Zur elektronentheorie der metalle, Annalen der Physik, 1, 566-613, 1900; 3, 369-402, 1900. See Ref. [2] for modern discussions of the Drude model and electrical conductivity.
2. N.W. Ashcroft and N.D. Mermin, Solid State Physics, Philadelphia, PA: Saunders College, 1976
3. C. Kittel, Introduction to Solid State Physics, 7th ed., New York: John Wiley & Sons, 1996.
4. L.B. Valdes, Resistivity measurements on germanium for transistors, Proc. I.R.E., 42, 420-427, 1954.
5. L.J. van der Pauw, A method of measuring specific resistivity and Hall effect of discs of arbitrary shape, Philips Res. Rep., 13, 1-9, 1958.
6. R. Chwang, B.J. Smith, and C.R. Crowell, Contact size effects on the van der Pauw method for resistivity and Hall coefficient measurement, Solid-State Electron., 17, 1217-1227, 1974.
7. H.H. Wieder, Laboratory Notes on Electrical and Galvanomagnetic Measurements, New York: Elsevier, 1979.
8. L.I. Maissel, Electrical properties of metallic thin films, 13-1 to 13-33, in L.I. Maissel and R. Glang (Eds.), Handbook of Thin Film Technology, San Francisco: McGraw-Hill, 1970.
9. D.C. Look, Electrical Characterization of GaAs Materials and Devices, New York: John Wiley & Sons, 1989.
10. D.C. Look, Bulk and contact electrical properties by the magneto-transmission-line method: application to GaAs, Solid-State Electron., 30, 615-618, 1987.