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Volumn 1992-December, Issue , 1992, Pages 35-38

A high speed SOI technology with 12 ps/18 ps gate delay operating at 5V/1.5V

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EFFECT TRANSISTORS; LOW POWER ELECTRONICS;

EID: 85051959597     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.1992.307303     Document Type: Conference Paper
Times cited : (18)

References (6)
  • 2
    • 0024629437 scopus 로고
    • Two-dimensional simulation and measurement of high performance MOSFET's made on a very thin soi film
    • M. Yoshimi et al, "Two-Dimensional Simulation and Measurement of High Performance MOSFET's Made on a Very Thin SOI Film", IEEE Trans on Electron Devices, vol. 36, No. 3, 1989.
    • (1989) IEEE Trans on Electron Devices , vol.36 , Issue.3
    • Yoshimi, M.1
  • 3
    • 0000452826 scopus 로고
    • A versatile, soi bicmos technology with complementary lateral BJT's
    • S. Parke et al, "A Versatile, SOI BiCMOS Technology with Complementary Lateral BJT's", 1992 IEDM.
    • (1992) IEDM
    • Parke, S.1
  • 4
    • 85067418640 scopus 로고    scopus 로고
    • The enhancement of GIDL current in SOI MOSFET and Its impact on soi device scaling
    • J. Chen et al, "The Enhancement of GIDL Current in SOI MOSFET and Its Impact on SOI Device Scaling", 1992 IEEE SOI Conference.
    • 1992 IEEE SOI Conference
    • Chen, J.1
  • 5
    • 0026853966 scopus 로고
    • Detailed analysis of edge effects in SIMOX-MOS transistors
    • T. Elewa et al, "Detailed Analysis of Edge Effects in SIMOX-MOS Transistors", IEEE Trans on Electron Devices, vol. 39, No. 4, 1992.
    • (1992) IEEE Trans on Electron Devices , vol.39 , Issue.4
    • Elewa, T.1
  • 6
    • 0026839362 scopus 로고
    • Ultra-fast (0. 5mm) CMOS circuits in fully depleted SOI films
    • A. Kamgar et al, "Ultra-Fast (0. 5mm) CMOS Circuits in Fully Depleted SOI Films", IEEE Trans on Electron Devices, vol. 39, No. 3, 1992.
    • (1992) IEEE Trans on Electron Devices , vol.39 , Issue.3
    • Kamgar, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.