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Volumn 1998-December, Issue , 1998, Pages 73-81

A sub 1 ω load-pull quarter-wave pre-matching network based on a two-tier TRL calibration

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPUTER AIDED DESIGN; ERROR CORRECTION; POWER TRANSISTORS; TUNERS;

EID: 85051793964     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1998.768627     Document Type: Conference Paper
Times cited : (11)

References (14)
  • 3
  • 4
    • 0016316146 scopus 로고
    • Automatic load-pull contour mapping for microwave power transistors
    • December
    • J. M. Cusak, et al, "Automatic Load-Pull Contour Mapping for Microwave Power Transistors, "IEEE Trunsactions on Microwave Tkory and Techniques, pp. 1146-1152, December 1974.
    • (1974) IEEE Trunsactions on Microwave Tkory and Techniques , pp. 1146-1152
    • Cusak, J.M.1
  • 7
    • 85051823817 scopus 로고    scopus 로고
    • Sonnet Software, Inc., Liverpool, NY
    • EM User's Manual, v. 4. 0, Sonnet Software, Inc., Liverpool, NY, 1997.
    • (1997) EM User's Manual, V. 4. 0
  • 8
    • 85051756000 scopus 로고
    • Hewlett-Packard Company
    • HP 85ZOC User's Manual, Hewlett-Packard Company, 1995.
    • (1995) HP 85ZOC User's Manual
  • 10
    • 0018720739 scopus 로고
    • Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer
    • December
    • G. Engen and C. Hoer, "'Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer, " IEEE Transactions on Microwave Theory and Techniques, pp. 987-993, December 1979.
    • (1979) IEEE Transactions on Microwave Theory and Techniques , pp. 987-993
    • Engen, G.1    Hoer, C.2
  • 12
    • 85051801692 scopus 로고    scopus 로고
    • National Institute of Standards and Technology
    • MultiCaP User's Manual, v. 1. 0, National Institute of Standards and Technology, 1997.
    • (1997) MultiCaP User's Manual, V. 1. 0
  • 13
    • 0026170230 scopus 로고
    • Characteristic impedance measurement delerminatioo using propagation measurement
    • June
    • R. Marks and D. William, "Characteristic Impedance Measurement Delerminatioo Using Propagation Measurement, " IEEE Microwave and Guided Wave Letters, pp. 141-143, June 1991.
    • (1991) IEEE Microwave and Guided Wave Letters , pp. 141-143
    • Marks, R.1    William, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.