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Volumn , Issue , 1991, Pages 295-300
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Ultrasonic time-of-flight method for on-line quantitation of semiconductor gases
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Author keywords
[No Author keywords available]
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Indexed keywords
ACOUSTIC WAVE VELOCITY;
ARCHITECTURAL ACOUSTICS;
BINARY MIXTURES;
CHEMICAL VAPOR DEPOSITION;
GAS MIXTURES;
SEMICONDUCTOR DEVICES;
SEMICONDUCTOR MATERIALS;
ULTRASONIC APPLICATIONS;
ACCURATE MEASUREMENT;
CHEMICAL VAPOR DEPOSITIONS (CVD);
CONCENTRATION MONITORING;
INITIAL CONCENTRATION;
MEASUREMENT ACCURACY;
PRACTICAL SOLUTIONS;
TEMPERATURE AND PRESSURES;
ULTRASONIC TIME OF FLIGHTS;
GASES;
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EID: 85051047610
PISSN: 10510117
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ULTSYM.1991.234173 Document Type: Conference Paper |
Times cited : (3)
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References (8)
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