Automated Measurement Procedures of Three-Port and Four-Port Devices on Silicon Wafers

49th ARFTG Conference Digest - Spring 1997: Characterization of Broadband Telecommunications Components and Systems

Volumn , Issue , 1997, Pages 122-131

  Rerat, F ^a   Carbonero, J L ^a   Morin, G ^a   Cabon, B ^b  

^a STMICROELECTRONICS   (Italy)

^b Grenoble INP Phelma   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; MOSFET DEVICES; SYSTEM-ON-CHIP;

ACTIVE COMPONENTS; AUTOMATED MEASUREMENT; FOUR-PORT MEASUREMENT; HIGH-FREQUENCY CHARACTERIZATION; INDUSTRIAL ENVIRONMENTS; PARASITIC ELEMENT; RF INTEGRATED CIRCUITS; SILICON TECHNOLOGIES;

SILICON WAFERS;

EID: 85050536882     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1997.327219     Document Type: Conference Paper

References (12)

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