Experimental investigation of on-wafer noise parameter measurement accuracy

47th ARFTG Conference Digest - Spring 1996: High Power RF/Microwave Device Measurements, ARFTG 1996

Volumn , Issue , 1996, Pages 10-13

  Boudiaf, Ali ^a   Scavennec, André ^b  

^a UNIVERSITÉ GUSTAVE EIFFEL   (France)

^b ORANGE LABS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EFFECT TRANSISTORS; MICROWAVE DEVICES; UNCERTAINTY ANALYSIS;

ACCURACY PROBLEMS; DIFFERENT STRUCTURE; EXPERIMENTAL INVESTIGATIONS; INPUT-OUTPUT; MISMATCHED SYSTEMS; NOISE PARAMETERS; ON-WAFER MEASUREMENTS; PASSIVE DEVICES;

PARAMETER ESTIMATION;

EID: 85049540201     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1996.327156     Document Type: Conference Paper

References (10)

1. G. Reeve, R. Marks, et al, "Microwave Monolithic Integrated Circuit-Related Metrology at The NIST", IEEE Trans. Instrumentation and Measurements., Dec. 1990.
2. J. M. Moniz, V. Adamian, and al, "Noise Parameter Measurement Accuracy and Repeatability Considerations", ATN Application Note AN-001, 1990.
3. A.C. Davidson, E. Strid, et al,"Accuracy Improvements in Microwave noise Parameter Measurements", IEEE Trans. Microwave Theory Techniques, vol. 37, pp. 19973-1978, Dec 1989.
4. A. Fraser, E. Strid, et al, "Repeatability and Verification of On-Wafer Noise Parameter Measurements", Microwave J., pp 172-176, Nov. 1988.
5. L. Escotte, J. Graffeuil, et al, "Using Cold FET to Check Accuracy of Microwave Noise Parameter Test-Set", Electron. Lett., pp 833-835, May 1991.
6. A. Boudiaf, M. Laporte, " An Accurate and Repeatable Technique for Noise Parameter Measurements", IEEE Trans. Instrumentation and Measurements, Vol. 42, pp 532-337, April 1993.
7. L. Escotte, R.Plana, et al, "Evaluation of Noise Parameter Extraction Methods", IEEE Trans. Microwave Theory Techniques, Vol. 41, pp 382-387, March 1993.
8. A. Boudiaf, N. Hassaine and al, FRANCE TELECOM Patent, N/Ref CNET/02112
9. A. Boudiaf, C. Dubon-Chevallier and al, " Verification of On-Wafer Noise Parameter Measurements", IEEE Trans. Instrumentation and Measurements, Vol. 44, pp 332-335, April 1995.
10. J. R. Fenton, "Noise Parameter Data Comparison While Varying th On-Wafer S-Parameter Calibration Technique" ARFTG 1994.