SCOAP: Sandia controllability/observability analysis program

Proceedings - Design Automation Conference

Volumn , Issue , 1980, Pages 190-196

  Goldstein, Lawrence H ^a   Thigpen, Evelyn L ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; DESIGN;

INTERNAL NODES; LOGICAL VALUES; SANDIA NATIONAL LABORATORIES; TESTABILITY; TESTABILITY ANALYSIS;

COMPUTER AIDED DESIGN;

EID: 85048855760     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/800139.804528     Document Type: Conference Paper

References (13)

1. L. H. Goldstein, "Controllability/Observability Analysis of Digital Circuits", CANDE Workshop, Mt. Hood, Oregon (1978).
2. L. H. Goldstein, "Controllability/Observability Analysis of Digital Circuits", IEEE Trans. Circuits and Systems, Vol. 26, No. 9, (1979).
3. L. H. Goldstein, "Controllability/Observability Analysis of Separable Logic Structures", Design for Testability Workshop, Boulder, Colorado (1979).
4. E. B. Eichelberger and T. W. Williams, "A Logic Design Structure for LSI Testability", Proc. 14th Design Automation Conf., pp 462-468 (1977).
5. W. Keiner and R. West, "Testability Measures", AUTOTESTCON, pp 49-55 (1977).
6. W. J. Dejka, "Measure of Testability in Device and System Design", Proc. 20th Midwest Symposium on Circuits and Systems", pp 39-52 (1977).
7. J. E. Stephenson and J. Grason, "A Testability Measure for Register Transfer Level Digital Circuits", Proc. 6th Fault-Tolerant Computing Symposium, pp 101-107 (1976).
8. J. Grason, "TMEAS, A Testability Measurement Program", Proc. 16th Design Automation Conference, pp 156-161 (1979).
9. Breuer and Associates, TEST/80-An Advanced ATG System for Digital Circuits, Report 1-77.
10. P. G. Kovijanic, "Testability Analysis", 1979 Semiconductor Test Conference. October 1979.
11. J. A. Dussault, "A Testability Measure", Proc. 1978 Semiconductor Test Conference, pp 113-116 (1978).
12. H. Y. Chang and G. H. Heimbigner, "LAMP: Controllability, Observability, and Maintenance Engineering Technique (COMET)", Bell System Tech. J., Vol. 53, No. 8, pp 1505-1534 (1974).
13. F. Barsi, F. Grandoni and P. Maestrini, "A Theory of Diagnosability of Digital Systems", IEEE Trans. Comput., Vol. C-25, pp 585-593 (1976).