Micro X-ray diffraction for painting and pigment analysis

AICCM Bulletin

Volumn 30, Issue 1, 2006, Pages 38-43

  Lau, Deborah ^a   Hay, David ^a   Wright, Natasha ^a  

^a CSIRO   (Australia)

Author keywords

in situ analysis; micro X ray diffraction; non destructive analysis; pigments

Indexed keywords

EID: 85046636325     PISSN: 10344233     EISSN: 22044183     Source Type: Journal    
DOI: 10.1179/bac.2006.30.1.005     Document Type: Article

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