Evaluation of single-crystal X-ray diffraction data from a position-sensitive detector

Journal of Applied Crystallography

Volumn 21, Issue 6, 1988, Pages 916-924

  Kabsch, W ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL SENSORS; PIXELS; SINGLE CRYSTALS; SPHERES; X RAY DETECTORS; X RAY DIFFRACTION;

CRYSTAL ROTATIONS; ELECTRONIC PICTURES; INITIALIZATION STEP; POSITION-SENSITIVE DETECTORS; SINGLE CRYSTAL DIFFRACTION DATA; SINGLE CRYSTAL X-RAY DIFFRACTION; THREE-DIMENSIONAL PROFILES; X-RAY WAVELENGTHS;

CRYSTAL ORIENTATION;

EID: 85046526624     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889888007903     Document Type: Article

References (0)