Beta-decay studies at the NSCL using a double-sided silicon strip detector

AIP Conference Proceedings

Volumn 680, Issue , 2003, Pages 550-553

  Morton, A C ^a  

^a MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INDUSTRIAL RESEARCH; POLARIMETERS;

BETA COUNTING; COUNTING SYSTEM; DECAY TIME; DETECTOR COMPONENTS; DIRECT MEASUREMENT; DOUBLE-SIDED SILICON STRIP DETECTORS; EXOTIC NUCLEI; GEANT4 SIMULATION;

SILICON SENSORS;

EID: 85041856911     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1619777     Document Type: Conference Paper

References (5)

1. Prisciandaro, J. I., Morton, A. C., and Mantica, P. F., Nucl. Instrum. Meth. in Phys. Res. A, in press.
2. Brown, B. A., and Rykaczewski, K., Phys. Rev. C 50, R2270-2273 (1994).
3. Bobyk, A., Kaminski, W., and Borzov, I.N., Acta Phys. Pol. B 31, 953-963 (2000).
4. Stolz, A., Faestermann, T., Schneider, R., et al., "Decay studies of N≈Z nuclei from 78Y to 102Sn" in International Nuclear Physics Conference 2001, edited by E. Norman et al., AIP Conference Proceedings 610, New York: American Institute of Physics, 2002, pp. 728-732.
5. The Geant4 Collaboration, http://wwwinfo.cern.ch/asd /geant4/geant4.html.