Donor related deep traps in MOMBE Ga0.51In0.49P/GaAs heterostructures: Influence on the low temperature performance of HEMTs

LEOS 1992 Summer Topical Meeting Digest on Broadband Analog and Digital Optoelectronics, Optical Multiple Access Networks, Integrated Optoelectronics, and Smart Pixels - 4th International Conference on Indium Phosphide and Related Materials, IPRM 1992

Volumn , Issue , 1992, Pages 389-392

  Ginoudi, A ^a   Paloura, E ^b   Kostandinidis, G ^a   Kiriakidis, G ^a   Garcia, J Ch ^c   Maurel, Ph ^c  

^a INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

^b ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^c THALES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; GALLIUM ALLOYS; III-V SEMICONDUCTORS; INDIUM ALLOYS; INDIUM PHOSPHIDE; INTEGRATED OPTOELECTRONICS; PIXELS; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR ALLOYS; SULFUR; TEMPERATURE;

DOPANT SELECTION; EFFECTIVE DOPING; HIGH ELECTRON MOBILITY TRANSISTOR (HEMTS); HIGH FREQUENCY DEVICES; HIGHLY-IONIZED; LOW TEMPERATURE PERFORMANCE; MATERIAL SYSTEMS; SULFUR DOPING;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 85034141849     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIPRM.1992.235669     Document Type: Conference Paper

References (11)

1. J. M. Olson, R. K. Ahrenkiel, D. J. Dunlavy, B. Keyes and A. E. Kibbler, Appl. Phys. Lett. 55, 1208 (1989)
2. T. Kobayashi, K. Taira, F. Nakamura and H. Kawai, J. Appl. Phys. 65, 4898 (1989)
3. J. Mavor, "Introduction to M. O. S L. S. I", Addition-Wesley (1983)
4. A. Kastalsky and R. A. Kiel, IEEE Trans. Electr. Dev. ED-33, 414 (1986)
5. Y. Chan, D. Pavlidis, M. Razeghi and F. Ommes, IEEE, Trans. Electr. Dev. 37, 2141 (1990)
6. J. Ch. Garcia, Ph. Maurel, Ph. Bove and J. P. Hirtz, J. Appl. Phys., March 1991
7. E. C. Paloura, A. Ginoudi, G. Kiriakidis and A. Christou, Appl. Phys. Lett., Dec. 1991
8. J. Yoshino, M. Tachikawa, N. Matsuda, M. Mizuta and H. Kukimoto, Jap. J. Appl. Phys. 23, L29 (1984)
9. G. Kiriakidis, J. Stoemenos, A. Ginoudi, K. Tsagaraki, Th. Dimoulas, J. P. Hirtz and Ph. Maurd. Proc. of the Conf. on "Defect Recognition and Imaging in Semiconductors Before and After Processing" (to be published in "Semiconductor Science and Technology"), Ed. M. Brozel, Manchester, March 18-20 (1991)
10. D. V. Lang, R. A. Logan and M. Jaros, Phys. Rev. B 19(2), 1015 (1979)
11. T. Yokoyama, M. Suzuki, T. Maeda, T. Ishikawa, T. Mimura and M. Abe, IEEE Elect. Dev. Lett., 11, 197 (1990)