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Volumn , Issue , 1992, Pages 53-58

Encapsulation of flip chip structures

Author keywords

[No Author keywords available]

Indexed keywords

CHIP SCALE PACKAGES; INDUSTRIAL ELECTRONICS; INTEGRATED CIRCUIT INTERCONNECTS; RELIABILITY ANALYSIS; SUBSTRATES; THERMAL CYCLING; THERMAL EXPANSION; THERMAL FATIGUE;

EID: 85032143232     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEMT.1992.639861     Document Type: Conference Paper
Times cited : (46)

References (12)
  • 1
    • 0000336248 scopus 로고
    • Controlled collapse reflow chip joining
    • L. F. Miller, "Controlled Collapse Reflow Chip Joining", IBM J. of Res. and Dev., 13(3), pp. 239-250, (1969).
    • (1969) IBM J. Of Res. Of Dev. , vol.13 , Issue.3 , pp. 239-250
    • Miller, L.F.1
  • 3
    • 0001481987 scopus 로고
    • Geometric optimization of controlled collapse interconnections
    • May
    • L. S. Goldman, "Geometric Optimization of Controlled Collapse Interconnections", IBM J. Res. Dev., pp. 251-265, May (1969).
    • (1969) IBM J. Res. Dev. , pp. 251-265
    • Goldman, L.S.1
  • 4
    • 0022983573 scopus 로고
    • Fatigue of 60/40 solder
    • H. D. Solomon, "Fatigue of 60/40 Solder", IEEE Tr. Comp. Hybrids Mfg. Tech., CHMT-9, No. 4, pp. 423-432, (1986).
    • (1986) IEEE Tr. Comp. Hybrids Mfg. Tech. , vol.CHMT-9 , Issue.4 , pp. 423-432
    • Solomon, H.D.1
  • 5
    • 84948484815 scopus 로고
    • Solder joint reliability of fine pitch solder bumped pad array carriers
    • K. Moore, S. Machuga, S. Bosserman, and John Stafford, "Solder Joint Reliability of Fine Pitch Solder Bumped Pad Array Carriers", Proceedings of NEPCON West, pp. 264-274, (1990).
    • (1990) Proceedings of NEPCON West , pp. 264-274
    • Moore, K.1    Machuga, S.2    Bosserman, S.3    Stafford, J.4
  • 6
    • 0002567364 scopus 로고
    • Resin insertion effect on thermal cycle resistivity of flip-chip mounted LSI devices
    • F. Nakano, T. Soga, and S. Amagi, "Resin Insertion Effect on Thermal Cycle Resistivity of Flip-Chip Mounted LSI Devices", ISHM Proceedings, pp. 536-541, (1987).
    • (1987) ISHM Proceedings , pp. 536-541
    • Nakano, F.1    Soga, T.2    Amagi, S.3
  • 12
    • 0017910257 scopus 로고
    • A new physical mechanism for soft errors in dynamic memories
    • T. C. May and M. H. Woods, "A New Physical Mechanism for Soft Errors in Dynamic Memories", Proc. Int. Rel. Phys. Symp., pp. 33-40, (1978).
    • (1978) Proc. Int. Rel. Phys. Symp. , pp. 33-40
    • May, T.C.1    Woods, M.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.