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Volumn , Issue , 1996, Pages 589-596

Design for testability of gated-clock FSMs

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FOR TESTABILITY; OBSERVABILITY; REDUNDANCY;

EID: 85030124698     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EDTC.1996.494361     Document Type: Conference Paper
Times cited : (3)

References (16)
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    • Meng, T.1    Gordon, B.2
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    • Power conscious cad tools and methodologies: A perspective
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    • Singh, D.1    Rabaey, J.M.2
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    • Guarded evaluation: Pushing power management to logic synthesis/design
    • April
    • V. Tiwari, S. Malik and P. Ashar, "Guarded evaluation: pushing power management to logic synthesis/design, " International Symposium on Low Power Design, pp. 221-226, April 1995.
    • (1995) International Symposium on Low Power Design , pp. 221-226
    • Tiwari, V.1    Malik, S.2    Ashar, P.3
  • 7
    • 0028728145 scopus 로고
    • Automatic synthesis of gated clocks for power reduction in sequential circuits
    • Dic
    • L. Benini, P. Siegel and G. De Micheli, "Automatic synthesis of gated clocks for power reduction in sequential circuits" IEEE Design and Test of Computers, pp. 32-40, Dic. 1994.
    • (1994) IEEE Design and Test of Computers , pp. 32-40
    • Benini, L.1    Siegel, P.2    De Micheli, G.3
  • 8
    • 0029182899 scopus 로고
    • Transformation and synthesis of FSMs for low power gated clock implementation
    • April
    • L. Benini and G. De Micheli, "Transformation and synthesis of FSMs for low power gated clock implementation " International Symposium on Low Power Design, pp. 21-26, April 1995.
    • (1995) International Symposium on Low Power Design , pp. 21-26
    • Benini, L.1    De Micheli, G.2
  • 10
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    • Power pc 603 microprocessor power management
    • June
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    • Suessmith, B.1    Paap, G.2
  • 15
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    • A unified approach to the synthesis of fully testable sequential machines
    • Jan
    • S. Devadas and K. Keutzer, "A unified approach to the synthesis of fully testable sequential machines, " IEEE Transactions on Computer-Aided Design, vol. 10, no. 4, pp. 39-51, Jan. 1991.
    • (1991) IEEE Transactions on Computer-Aided Design , vol.10 , Issue.4 , pp. 39-51
    • Devadas, S.1    Keutzer, K.2
  • 16
    • 0027632531 scopus 로고
    • Redundancy identification/removal and test generation for sequential circuits using implicit state enumeration
    • july
    • H. Cho, G. Hachtel and F. Somenzi, "Redundancy Identification/Removal and Test Generation for Sequential Circuits Using Implicit State Enumeration, " IEEE Transactions on Computer-Aided Design, vol. 12, no. 7, pp. 935-45, july 1993.
    • (1993) IEEE Transactions on Computer-Aided Design , vol.12 , Issue.7 , pp. 935-945
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.