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Volumn 37, Issue 3, 2005, Pages 357-363
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Testing resistance: Busno‐cratic power, standardized tests, and care of the self
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Author keywords
Busno cratic power; High stakes testing; Test anxiety
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Indexed keywords
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EID: 85028957526
PISSN: 00131857
EISSN: 14695812
Source Type: Journal
DOI: 10.1111/j.1469-5812.2005.00126.x Document Type: Article |
Times cited : (5)
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References (5)
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