Cathodic and defect properties of BaxSr1-xTi1-yFeyO3-y/2+δ mixed conducting oxides

Solid State Ionics

Volumn 230, Issue C, 2013, Pages 2-6

  Kim, Jae Jin ^a   Kuhn, Melanie ^a   Bishop, Sean R ^a,b   Tuller, Harry L ^a,b  

^a Massachusetts Institute of Technology   (United States)

^b KYUSHU UNIVERSITY   (Japan)

Author keywords

BSTF; Cathode; Defects; Mixed conductor; SOFC; Thin film

Indexed keywords

ACTIVATION ENERGY; CATHODES; DEFECTS; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTRODES; ELECTROMAGNETIC WAVE ABSORPTION; ENERGY GAP; FUEL CELLS; LIGHT ABSORPTION; PULSED LASER DEPOSITION; SINGLE CRYSTALS; THERMOGRAVIMETRIC ANALYSIS; THIN FILMS; TITANIUM OXIDES; YTTRIA STABILIZED ZIRCONIA; ZIRCONIA;

BSTF; CATH-ODE MATERIALS; CATHODIC BEHAVIOR; ELECTRODE IMPEDANCE; MIXED CONDUCTING OXIDES; MIXED CONDUCTORS; OXYGEN NON-STOICHIOMETRY; SURFACE DEGRADATION;

SOLID OXIDE FUEL CELLS (SOFC);

EID: 85027947594     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2012.06.023     Document Type: Article

References (23)

1. B. C. H. Steele, A. Heinzel, Nature 414 (2001) 345.
2. M. Mogensen, K. Kammer, Annu. Rev. Mater. Res. 33 (2003) 321.
3. S. B. Adler, Chem. Rev. 104 (2004) 4791.
4. Sossina M. Haile, Acta Mater. 51 (2003) 5981.
5. L. Wang, R. Merkle, J. Maier, J. Electrochem. Soc. 157 (2010) B1802.
6. W. Jung, H. L. Tuller, J. Electrochem. Soc. 155 (2008) B1194.
7. W. Jung, H. L. Tuller, Solid State Ionics 180 (2009) 843.
8. W. Jung, H. L. Tuller, Adv. Energy Mater. 1 (2011) 1184.
9. R. D. Shannon, Acta Crystallogr. A 32 (1976) 751.
10. M. P. Pechini. U. S. Patent (1967) 3330697.
11. M. Kakihana, M. Yoshimura, Bull. Chem. Soc. Jpn. 72 (1999) 1427.
12. B. D. Cullity, Elements of X-ray Diffraction, 3rd edition Prentice-Hall, Englewood Cliffs, 2001.
13. D. Marrocchelli, S. R. Bishop, H. L. Tuller, B. Yildiz, Adv. Funct. Mater. 22 (2012) 1958.
14. A. Rothschild, W. Menesklou, H. L. Tuller, E. Ivers-Tiffée, Chem. Mater. 18 (2006) 3651.
15. F. A. Kröger, Solid State Physics, Academic Press, New York, 1956.
16. M. Cardona, Phys. Rev. 140 (1965) A651.
17. S. Zollner, A. A. Demkov, R. Liu, P. L. Fejes, R. B. Gregory, P. Alluri, J. A. Curless, Z. Yu, J. Ramdani, R. Droopad, T. E. Tiwald, J. N. Hilfiker, J. A. Woollam, J. Vac. Sci. Technol. B 18 (2000) 2242.
18. P. Y. Yu, Fundamentals of Semiconductors, Springer, Berlin, 1996.
19. P. Abelard, J. F. Baumard, Phys. Rev. B 26 (1982) 1005.
20. M. Arnold, H. Wang, A. Feldhoff, J. Membr. Sci. 293 (2007) 44.
21. E. Bucher, A. Egger, G. B. Caraman, W. Sitte, J. Electrochem. Soc. 155 (2008) B1218.
22. S. Švarcová, K. Wiik, J. Tolchard, H. J. M. Bouwmeester, T. Grande, Solid State Ionics 178 (2008) 1787.
23. W. Jung, H. L. Tuller, Energy Environ. Sci. 5 (2012) 5370.