Role of electron-and hole-collecting buffer layers on the stability of inverted polymer: Fullerene photovoltaic devices

IEEE Journal of Photovoltaics

Volumn 4, Issue 1, 2014, Pages 265-270

  Voroshazi, Eszter ^a   Cardinaletti, Ilaria ^a   Uytterhoeven, Griet ^a   Li, Shan ^a   Empl, Max ^a,b   Aernouts, Tom ^a   Rand, Barry P ^a  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Degradation; interface phenomena; organic semiconductors; oxygen; solar cells

Indexed keywords

DEGRADATION; FULLERENES; MOLYBDENUM OXIDE; OXYGEN; PHOTOELECTROCHEMICAL CELLS; PHOTOVOLTAIC CELLS; SEMICONDUCTING ORGANIC COMPOUNDS; SOLAR CELLS;

AIR STABILITY; DEVICE PERFORMANCE; FAILURE MECHANISM; HOLE-COLLECTING BUFFER LAYERS; INTERFACE PHENOMENA; INVERTED ARCHITECTURES; PHOTOVOLTAIC DEVICES; SOLUTION-PROCESSED;

POLYMERS;

EID: 85027944253     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2013.2287913     Document Type: Article

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