SCOPUS 정보 검색 플랫폼

Volumn 203, Issue , 2013, Pages 8-18

Electron microscopy analyses and electrical properties of the layered Bi2WO6 phase

(9) Taoufyq, A a,b,c,d Ait Ahsaine, H b Patout, L a Benlhachemi, A b Ezahri, M b Guinneton, F a Lyoussi, A c Nolibe, G d Gavarri, J R a

a UNIVERSITÉ DE TOULON (France)

b FACULTÉ DES SCIENCES (Morocco)

c DIF (France)

d Signals and Systems (France)

Author keywords

Bismuth tungstate; Co precipitation method; Electrical conduction; Transmission electron microscopy

Indexed keywords

BISMUTH; COPRECIPITATION; DIFFERENTIAL THERMAL ANALYSIS; ELECTRON MICROSCOPY; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; OXYGEN VACANCIES; RIETVELD ANALYSIS; SCANNING ELECTRON MICROSCOPY; THERMOANALYSIS; THERMOGRAVIMETRIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION;

BISMUTH TUNGSTATES; COPRECIPITATION METHOD; ELECTRICAL CONDUCTION; ELECTRICAL IMPEDANCE; ELECTRON CONDUCTION; ELECTRON MICROSCOPY ANALYSIS; ELECTRONIC CONTRIBUTIONS; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY;

ATMOSPHERIC TEMPERATURE;

EID: 85027941454 PISSN: 00224596 EISSN: 1095726X Source Type: Journal
DOI: 10.1016/j.jssc.2013.04.001 Document Type: Article

Times cited : (21)

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