Microstructure and morphology in the PVDF films doped with BiCl3

Polymer Bulletin

Volumn 66, Issue 6, 2011, Pages 821-830

  Wang, Qingping ^a,b   Jiang, Shenglin ^b   Zhang, Yangyang ^b   Zhang, Guangzu ^b   Xiong, Longyu ^b  

^a HUBEI UNIVERSITY OF EDUCATION   (China)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Dielectric properties; FTIR; PVDF; SEM; XRD

Indexed keywords

DIELECTRIC PROPERTIES; FREE RADICALS; MICROSTRUCTURE; ORGANIC POLYMERS; SCANNING ELECTRON MICROSCOPY; THICK FILMS; X RAY DIFFRACTION;

DEGREE OF CRYSTALLINITY; DEGREE OF CRYSTALLIZATION; FOURIER TRANSFORM INFRARED; FTIR; POLYVINYLIDENE FLUORIDES; PVDF; RELATIVE DIELECTRIC CONSTANT; SOLVENT CASTING METHOD;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

EID: 85027927679     PISSN: 01700839     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00289-010-0383-x     Document Type: Article

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