Corner detection using the map technique

Proceedings - International Conference on Pattern Recognition

Volumn 1, Issue , 1994, Pages 549-552

  Zhang, Xining ^a   Haralick, Robert M ^a   Ramesh, Visvanathan ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BASIC THEORY; CORNER ANGLE; CORNER DETECTION; CORNER DETECTOR; DETECTION METHODS; GAUSSIAN RANDOM VARIABLE; LINE-SEGMENTS; MAXIMUM A POSTERIORI; SAMPLE POINT; SPECIFIC PROTOCOL;

EDGE DETECTION;

EID: 85027621514     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPR.1994.576354     Document Type: Conference Paper

References (11)

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10. V. Ramesh, et al, "Automatic Tuning parameter seletection for feature extraction sequence," to appear in Proceedings of CVPR'94 conf. June 1994, Seattle, WA.
11. X. Zhang et al, "Corner Detection using the MAP Technique," Intelligent Systems Lab Internal Report, University of Washington, Seattle, WA, 1994.