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Volumn 214, Issue 36770, 2000, Pages 1279-
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Guided-Ion Beam Measurements of Ar+ + Ar Symmetric Charge-transfer Cross Sections at Ion Energies Ranging from 0.2 to 300 eV
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 85026017251
PISSN: 09429352
EISSN: None
Source Type: Journal
DOI: 10.1524/zpch.2000.214.9.1279 Document Type: Article |
Times cited : (7)
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References (33)
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