TH‐C‐L100F‐02: Instrumentation Noise Equivalent Exposure (INEE) and the Effect of Detector Blurring and Image Post‐Process Smoothing: A Simulation Study

Medical Physics

Volumn 34, Issue 6, 2007, Pages 2619-

  Yadava, G ^a   Rudin, S ^a   Kuhls, A ^a   Bednarek, D ^a  

^a UNIVERSITY AT BUFFALO   (United States)

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EID: 85024823261     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.2761629     Document Type: Article

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