X1A: Second‐generation undulator beamlines serving soft x‐ray spectromicroscopy experiments at the NSLS

Review of Scientific Instruments

Volumn 67, Issue 9, 1996, Pages 3359-

  Winn, B ^{a,b,c,d,e,f,g}   Ade, H ^{a,b,c,d,e,f,g}   Buckley, C ^{a,b,c,d,e,f,g}   Howells, M ^{a,b,c,d,e,f,g}   Hulbert, S ^{a,b,c,d,e,f,g}   Jacobsen, C ^{a,b,c,d,e,f,g}   Kirz, J ^{a,b,c,d,e,f,g}   Mcnulty, I ^{a,b,c,d,e,f,g}   Miao, J ^{a,b,c,d,e,f,g}   Oversluizen, T ^{a,b,c,d,e,f,g}   Pogorelski, I ^{a,b,c,d,e,f,g}   Wirick, S ^{a,b,c,d,e,f,g}  

^a STONY BROOK UNIVERSITY   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c KING'S COLLEGE LONDON   (United Kingdom)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^e BROOKHAVEN NATIONAL LABORATORY   (United States)

^f ARGONNE NATIONAL LABORATORY   (United States)

^g Creative Instrumentation   (United States)

Author keywords

BNL; EV RANGE 100 1000; MICROSCOPY; NSLS; RADIATION FLUX; SOFT X RADIATION; SYNCHROTRON RADIATION; USES; X RAY SOURCES

Indexed keywords

EID: 85024789344     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.1147466     Document Type: Conference Paper

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