Electrical and thermal feedback effects on the small-signal drain characteristics of partially-depleted SOI MOSFETS

Proceedings - IEEE International SOI Conference

Volumn , Issue , 1992, Pages 122-123

  Redman White, W ^a   Uren, M J ^b   Bunyan, R J T ^b   Howes, R ^a   Lee, M ^a   Alderman, J ^c  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^b DRA   (United Kingdom)

^c UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85024195968     PISSN: 1078621X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SOI.1992.664824     Document Type: Conference Paper

References (3)

1. Lim and Fossum "Transient drain current propagation delay in SOI CMOS", IEEE Trans ED-31, 1984.
2. Le Neel and Haond, "Electrical study of transient negative resistance in SOI MOSFETs", Elec. Lett, 26, 1990.
3. Howes and Redman-White "Measurement and analysis of small-signal drain admittance is SOS MOSFETs", Elec Lett, 27, 1991.