Topology of technology graphs: Small world patterns in electronic circuits

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 64, Issue 4, 2001, Pages 5-

  Cancho, Ramon Ferrer I ^a   Janssen, Christiaan ^a   Solé, Ricard V ^a,b,c  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

^b SANTA FE INSTITUTE   (United States)

^c CSIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85020820338     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.64.046119     Document Type: Article

References (29)

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