A scan-chain based state retention methodology for IoT processors operating on intermittent energy

Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017

Volumn , Issue , 2017, Pages 1171-1176

  Hager, Pascal Alexander ^a   Fatemi, Hamed ^b   De Gyvez, Jose Pineda ^b   Benini, Luca ^a,c  

^a ETH ZURICH   (Switzerland)

^b NXP SEMICONDUCTORS   (Netherlands)

^c UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHAINS; DATA STORAGE EQUIPMENT; DIGITAL STORAGE; ENERGY EFFICIENCY; FLIP FLOP CIRCUITS; OUTAGES;

BATTERYLESS SYSTEMS; ENERGY HARVESTER; NON-VOLATILE MEMORY; POWER OVERHEAD; RESIDUAL ENERGY; SOFTWARE MECHANISMS; STATE OF THE ART; STATE-RETENTION;

INTERNET OF THINGS;

EID: 85020195961     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.23919/DATE.2017.7927166     Document Type: Conference Paper

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