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Volumn 1998-January, Issue , 1998, Pages
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Linear feature detectors and their application to cereal inspection
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Author keywords
[No Author keywords available]
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Indexed keywords
PATTERN RECOGNITION;
SIGNAL PROCESSING;
FINGERPRINT RECOGNITION;
LINE SEGMENT;
LINE SEGMENT DETECTION;
LINEAR FEATURE;
FEATURE EXTRACTION;
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EID: 85019574795
PISSN: 22195491
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (8)
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