Lodging resistance and yield potential of winter wheat: Effect of planting density and genotype

Frontiers of Agricultural Science and Engineering

Volumn 2, Issue 2, 2015, Pages 168-178

  Xiao, Yonggui ^a   Liu, Jianjun ^b   Li, Haosheng ^b   Cao, Xinyou ^b   Xia, Xianchun ^a   He, Zhonghu ^a  

^a INSTITUTE OF PLANT PROTECTION   (China)

^b SHANDONG PEANUT RESEARCH INSTITUTE   (China)

Author keywords

Common wheat; Leaf area index; Lodging performance; Pushing resistance; Yield potential

Indexed keywords

EID: 85019403564     PISSN: 20957505     EISSN: 2095977X     Source Type: Journal    
DOI: 10.15302/J-FASE-2015061     Document Type: Article

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