X-ray Photoelectron Spectroscopy Studies of Oxidized and Reduced Ce0.8Zr0.2O2(111) Surfaces

Surface Science Spectra

Volumn 11, Issue 1, 2004, Pages 82-90

  Azad, Samina ^a   Engelhard, Mark ^b   Peden, C H F ^a   Thevuthasan, S ^b  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM OXIDE; ELECTRONIC STRUCTURE; FLUORSPAR; MOLECULAR BEAM EPITAXY; MOLECULAR OXYGEN; OXYGEN VACANCIES; PHOTOELECTRONS; PHOTONS; X RAY DIFFRACTION; YTTRIA STABILIZED ZIRCONIA;

ELECTRONIC.STRUCTURE; EX SITU; HIGH-ENERGY RESOLUTION; OXYGEN PLASMA-ASSISTED MOLECULAR-BEAM EPITAXY; REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION; SITU REFLECTION; SITU X-RAY DIFFRACTION; TRANSMISSION ELECTRON; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES; X-RAY PHOTOELECTRONS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 85018479611     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/11.20050202     Document Type: Article

References (4)

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3. M. A.Henderson, C. L.Perkins, M. H.Engelhard, S.Thevuthasan, and C. H. F.Peden, Sur. Sci. 526, 1 (2003). 10.1016/S0039-6028(02)02657-2
4. D. A.Shirley, Phys. Rev. 55, 4709 (1975).