A thin film technology eddy current microsensor

INTERMAG Europe 2002 - IEEE International Magnetics Conference

Volumn , Issue , 2002, Pages

  Gatzen, H H ^a   Iswahjudi, H ^a   Andreeva, E ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; IRON; MICROSENSORS; NONDESTRUCTIVE EXAMINATION;

INSPECTION TECHNIQUE; MICRON SCALE; NON DESTRUCTIVE TESTING; SURFACE MICROCRACKS; THIN-FILM TECHNOLOGY;

EDDY CURRENT TESTING;

EID: 85017249942     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/INTMAG.2002.1001435     Document Type: Conference Paper

References (2)

1. nd Edition, Chapman & Hall, 1997.
2. Daniel J. Sadler and Chong H. Ahn, "On-Chip Eddy Current Sensor for Crack Detection in Metals", Solid-State Sensor and Actuator Workshop, Hilton Head Island, South Carolina, June 4-8, 2000.