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1
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0002106368
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Nanoelectromechanical Systems Face the Future
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M.L. Roukes, “Nanoelectromechanical Systems Face the Future”, Physics World, 14, 25 (2001).
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(2001)
Physics World
, vol.14
, pp. 25
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Roukes, M.L.1
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2
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33744820846
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Self-Sensing Micro-and Nanocantilevers with Attonewton-Scale Force Resolution
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xxxx (in press
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J.L. Arlett, J.R. Maloney, B. Gudlewski, M. Muluneh, M.L. Roukes, “Self-Sensing Micro-and Nanocantilevers with Attonewton-Scale Force Resolution”, Nano Lett., 6, xxxx (in press) (2006).
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(2006)
Nano Lett
, vol.6
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Arlett, J.L.1
Maloney, J.R.2
Gudlewski, B.3
Muluneh, M.4
Roukes, M.L.5
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3
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0002106368
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Nanoelectromechanical Systems Face the Future
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M.L. Roukes, “Nanoelectromechanical Systems Face the Future”, Physics World, 14, 25 (2001).
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(2001)
Physics World
, vol.14
, pp. 25
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Roukes, M.L.1
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4
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21644480743
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Mechanical Computation, Redux?
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San Francisco, CA, 12/13-15/04, 539
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M.L. Roukes, “Mechanical Computation, Redux?”, Tech. Digest, IEEE IEDM 2004, San Francisco, CA, 12/13-15/04, 539 (2004).
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(2004)
Tech. Digest, IEEE IEDM 2004
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Roukes, M.L.1
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5
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0002106368
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Nanoelectromechanical Systems Face the Future
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M.L. Roukes, “Nanoelectromechanical Systems Face the Future”, Physics World, 14, 25 (2001).
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(2001)
Physics World
, vol.14
, pp. 25
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Roukes, M.L.1
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6
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28144447264
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VHF, UHF and Microwave Nanomechanical Resonators
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X.M.H. Huang, X.L. Feng, C.A. Zorman, M.Mehregany, M.L. Roukes, “VHF, UHF and Microwave Nanomechanical Resonators”, New J. Phys., 7, 247 (2005).
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(2005)
New J. Phys.
, vol.7
, pp. 247
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Huang, X.M.H.1
Feng, X.L.2
Zorman, C.A.3
Mehregany, M.4
Roukes, M.L.5
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7
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4344658558
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Ultrahigh-Quality Silicon Carbide Single Crystal”
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D. Nakamura, I. Gunjishima, S. Yamaguchi, T. Ito, A. Okamoto, H. Kondo, S. Onda, K. Takatoir, “Ultrahigh-Quality Silicon Carbide Single Crystal”, Nature, 430, 1009 (2004).
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(2004)
Nature
, vol.430
, pp. 1009
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Nakamura, D.1
Gunjishima, I.2
Yamaguchi, S.3
Ito, T.4
Okamoto, A.5
Kondo, H.6
Onda, S.7
Takatoir, K.8
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8
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10944253160
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Surface Roughness Control of 3C-SiC Films during the Epitaxial Growth Process
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X.A. Fu, C.A. Zorman, M. Mehregany, “Surface Roughness Control of 3C-SiC Films during the Epitaxial Growth Process”, J. Electrochem. Society, 151, G910 (2004).
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(2004)
J. Electrochem. Society
, vol.151
, pp. 910
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Fu, X.A.1
Zorman, C.A.2
Mehregany, M.3
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9
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0033080270
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External Control of Dissipation in a Nanometer-Scale Radiofrequency Mechanical Resonator
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A.N. Cleland, M.L. Roukes, “External Control of Dissipation in a Nanometer-Scale Radiofrequency Mechanical Resonator”, Sensors and Actuators, 72, 256 (1999).
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(1999)
Sensors and Actuators
, vol.72
, pp. 256
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Cleland, A.N.1
Roukes, M.L.2
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10
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0000018940
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Thermoelastic Damping in Micro-and Nanomechanical Systems
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R. Lifshitz, M.L. Roukes, “Thermoelastic Damping in Micro-and Nanomechanical Systems”, Phys. Rev. B, 61, 5600 (2000).
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(2000)
Phys. Rev. B
, vol.61
, pp. 5600
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Lifshitz, R.1
Roukes, M.L.2
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11
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0035880838
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Elastic Wave Transmission at an Abrupt Junction in a Thin Plate with Application to Heat Transport and Vibrations in Mesoscopic Systems
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M.C. Cross, R. Lifshitz, “Elastic Wave Transmission at an Abrupt Junction in a Thin Plate with Application to Heat Transport and Vibrations in Mesoscopic Systems”, Phys. Rev. B, 64, 085324 (2001).
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(2001)
Phys. Rev. B
, vol.64
, Issue.85324
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Cross, M.C.1
Lifshitz, R.2
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12
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0001570529
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Low-Temperature Internal Friction in Metal Films and in Plastically Deformed Bulk Aluminum
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X. Liu, E. Thompson, B.E. White Jr., R.O. Pohl, “Low-Temperature Internal Friction in Metal Films and in Plastically Deformed Bulk Aluminum”, Phys. Rev. B, 59, 11767 (1999).
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(1999)
Phys. Rev. B
, vol.59
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Liu, X.1
Thompson, E.2
White, B.E.3
Pohl, R.O.4
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13
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0033892144
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Quality Factors in Micron-and Submicron-Thick Cantilevers
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K.Y. Yasumura, T.D. Stowe, E.M. Chow, T. Pfafman, T.W. Kenny, B.C. Stipe, D. Rugar, “Quality Factors in Micron-and Submicron-Thick Cantilevers”, J. MEMS, 9, 117 (2000).
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(2000)
J. MEMS
, vol.9
, pp. 117
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Yasumura, K.Y.1
Stowe, T.D.2
Chow, E.M.3
Pfafman, T.4
Kenny, T.W.5
Stipe, B.C.6
Rugar, D.7
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