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Volumn , Issue , 2016, Pages 1647-1652

Big-data-driven anomaly detection in industry (4.0): An approach and a case study

Author keywords

Anomaly Detection; Big Data; CEP; Data driven Quality Control; Industrie 4.0

Indexed keywords

COMPUTER AIDED DESIGN; DATA HANDLING; INFORMATION MANAGEMENT; MICROWAVE OVENS; PROCESS CONTROL; QUALITY ASSURANCE; QUALITY CONTROL; QUALITY MANAGEMENT; SIGNAL DETECTION;

EID: 85015218171     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/BigData.2016.7840777     Document Type: Conference Paper
Times cited : (101)

References (4)
  • 1
    • 84963749415 scopus 로고    scopus 로고
    • Big data process analytics for continuous process improvement in manufacturing
    • Nenad Stojanovic, Marko Dinic, Ljiljana Stojanovic: Big data process analytics for continuous process improvement in manufacturing. Big Data 2015: 1398-1407
    • (2015) Big Data , pp. 1398-1407
    • Stojanovic, N.1    Dinic, M.2    Stojanovic, L.3
  • 2
    • 28244475768 scopus 로고    scopus 로고
    • Semiconductor anufacturing process control and monitoring: A Fab-wide framework
    • Qin SJ, Cherry G, Good R, Wang J, Harrison CA. Semiconductor anufacturing process control and monitoring: A Fab-wide framework. J Process Control 2006;16: 179-91.
    • (2006) J Process Control , vol.16 , pp. 179-191
    • Qin, S.J.1    Cherry, G.2    Good, R.3    Wang, J.4    Harrison, C.A.5
  • 3
    • 85015161783 scopus 로고    scopus 로고
    • http://static.googleusercontent.com/media/research.google.co m/en//archive/mapreduce-osdi04.pdf


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.