Automated data collection in single particle electron microscopy

Microscopy (Oxford, England)

Volumn 65, Issue 1, 2016, Pages 43-56

  Tan, Yong Zi ^a   Cheng, Anchi ^a   Potter, Clinton S ^a   Carragher, Bridget ^a  

^a Columbia University ^*  (United States)

Author keywords

automation; data collection; high throughput; single particle electron microscopy; software packages; target acquisition

Indexed keywords

AUTOMATION; CRYOELECTRON MICROSCOPY; DEVICES; IMAGE PROCESSING; INFORMATION PROCESSING; PROCEDURES; SOFTWARE;

AUTOMATION; CRYOELECTRON MICROSCOPY; DATA COLLECTION; IMAGE PROCESSING, COMPUTER-ASSISTED; SOFTWARE;

EID: 85014529372     PISSN: None     EISSN: 20505701     Source Type: Journal    
DOI: 10.1093/jmicro/dfv369     Document Type: Review

References (0)