Detection of Process Failures in Layerwise Laser Melting with Optical Process Monitoring

Physics Procedia

Volumn 39, Issue , 2012, Pages 753-759

  Craeghs, Tom ^a   Clijsters, Stijn ^a   Kruth, Jean Pierre ^a   Bechmann, Florian ^b   Ebert, Marie Christin ^b  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b External Research Projects Standardization   (Germany)

Author keywords

Laser Melting; Optical process monitoring; Process control

Indexed keywords

EID: 85014461057     PISSN: 18753884     EISSN: 18753892     Source Type: Conference Proceeding    
DOI: 10.1016/j.phpro.2012.10.097     Document Type: Conference Paper

References (12)

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