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Volumn 9, Issue 2-4, 2001, Pages 263-272

Stress measurements in thin zirconia films at 300°C using synchrotron radiation

Author keywords

Oxidation; Residual stresses; Synchrotron radiation; Thin films; X ray diffraction; Zirconium alloys

Indexed keywords


EID: 85013619216     PISSN: 10238166     EISSN: 14772655     Source Type: Journal    
DOI: 10.1080/10238160108200151     Document Type: Article
Times cited : (2)

References (9)
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  • 4
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    • A model for the oxidation of zirconium-based alloys
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  • 5
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    • Oxidation of zirconium alloys-crystallographic texture of zirconia: Interpretation and mechanical consequences
    • Parise, M., Touet, I. and Sicardy, O. (1998) "Oxidation of zirconium alloys-crystallographic texture of zirconia: interpretation and mechanical consequences", Textures and Microstructures 30, 247-263.
    • (1998) Textures and Microstructures , vol.30 , pp. 247-263
    • Parise, M.1    Touet, I.2    Sicardy, O.3
  • 6
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    • 2
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    • Nevitt, M.V.1
  • 8
    • 0032115647 scopus 로고    scopus 로고
    • Modelling of the mechanical behaviour of the metal-oxide system during Zr alloy oxidation
    • Parise, M., Sicardy, O. and Cailletaud, G. (1998) "Modelling of the mechanical behaviour of the metal-oxide system during Zr alloy oxidation", J. Nucl. Mater. 256, 35-46.
    • (1998) J. Nucl. Mater. , vol.256 , pp. 35-46
    • Parise, M.1    Sicardy, O.2    Cailletaud, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.