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Volumn 9, Issue 2-4, 2001, Pages 263-272
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Stress measurements in thin zirconia films at 300°C using synchrotron radiation
a a a a
a
CEA GRENOBLE
(France)
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Author keywords
Oxidation; Residual stresses; Synchrotron radiation; Thin films; X ray diffraction; Zirconium alloys
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Indexed keywords
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EID: 85013619216
PISSN: 10238166
EISSN: 14772655
Source Type: Journal
DOI: 10.1080/10238160108200151 Document Type: Article |
Times cited : (2)
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References (9)
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