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Volumn 13, Issue 4, 2005, Pages 267-274
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Normalisation of the resolution function in TOF technique
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Author keywords
Data analysis; Inelastic scattering
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Indexed keywords
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EID: 85013616362
PISSN: 10238166
EISSN: 14772655
Source Type: Journal
DOI: 10.1080/10238160512331330189 Document Type: Article |
Times cited : (14)
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References (9)
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